Materials and Surfaces characterization


The morphological properties of surfaces play a key role in the industrial processes management: wear resistance, friction, adhesion, biocompatibility, optical property…. Our analysis center can measure the morphological parameters (thickness, roughness…) by using different techniques:

  • microscopic analysis of surface morphology,
  • microstructure analysis,
  • Identification of contaminants (defects, size, shape, structure)
  • Thickness layer measurement
  • Roughness measurement (Ra, Rt, Rq,…) using mechanical profilometer or Atomic Force Microscopy AFM)
  • Size measurement of particles or powders in solutions using laser particle size.

Physico-chemical analysis and composition

The physico-chemical analysis uses various analysis techniques which aim to confirm the intrinsic material properties (molecules, atoms) or study their behavior when face with a defined stress.

The analysis center performs qualitative and quantitative analytical tests on all types of supports and materials. The nature, purity, and impurities are critical parameters for the quality of the production and manufacturing process.

Different analysis techniques are available in order to meet your needs and expectations :

  • Analysis of contaminants : dust, particles, surface defects,…
  • Coating analysis: adhesion issues, surface defects, blistering, scratches,…
  • Smudge composition analysis

Our skilled team can offer you various services:

  • Characterization of the chemical composition of the materials (bulk / surface/interface: thin layers)
    o Nature of the elements : SEM-EDS, XRF, XPS-ESCA, ToF-SIMS, TEM-EDS
    o Molecular analysis : ToF-SIMS, FTIR, RAMAN
    o Low concentrations detection : ToF-SIMS, XRF
    o Concentration (profiles (nm – µm)) : XPS, SEM-EDS, GDOES
    o Chemical state of the elements: chemical bonding, functional groups, oxidation state : ToF-SIMS, XPS, FTIR, RAMAN
  • Position of the elements (or locating the elements) :
    o Lateral : chemical mapping : SEM EDS, ToF-SIMS, XPS, RAMAN, TEM-EDS
    o In depth : profiles : XPS, ToF-SIMS, EDS on the edge

Structural analysis

As a key complement of elementary chemical analysis to identify compounds, the X-Rays diffraction allows the characterization of compounds and enables specific characterization of crystallized materials or powder: metals, minerals, ceramics, pharmaceutical compounds, organometallic complex, …

The structural analysis helps getting information on the arrangement of atoms in a crystalline material.

The type of 3D geometric arrangement (network) and the distances between the atoms (mesh size) are a unique ID for each compound. The properties (chemical, mechanical, …) of materials are related to their (s) structure (s) crystallography

crystallinity can be characterized through the analytical techniques available in our centre: identification and quantification of the crystallographic phases (qualitative and quantitative)

  • Thin layer analysis (grazing angle)
  • Microscopic identification of crystals