Physicochemical analysis & Spectroscopic
New ToF-SIMS M6
PERKIN ELMER OPTIMA 7300DV – ICP-OES OPTICAL SPECTROMETER
Contact angle measurement Surface tension analysis
FTIR
TRIBOLAB (BRUKER)
Bruker Senterra micro-Raman spectrometer
X-RAY DIFFRACTION (XRD)
Infrared Spectrometer (IRTF)
Scanning Electron Microscope (SEM)
Time of Flight – Secondary Ion Mass Spectrometry (ToF-SIMS)
X-ray photoelectron spectroscopy (XPS)