• Start of the project : 01-11-17
  • End of project : 31-10-20


Products that require complicated material systems and structural organization at the nano-scale, for example third-generation solar cells, are often difficult to develop. This is because the electronic properties of bulk semiconductors are often masked or at least strongly overlaid by the interface properties of the materials. In addition, these interface properties are also complex and therefore make product design difficult.

This project aims to solve this problem by providing a nanoscale characterization platform for European manufacturers of coatings, photovoltaic cells and semiconductor circuits. It is proposed to use a combination of scanning microwave microscopes, dielectric resonators and simulation to measure the properties of materials and system interfaces of complex materials and nanostructures. A metrological system of cross-checks between different instruments, models and simulations with associated error bars is essential to obtain reliable results.

Objectives and missions of Materia Nova

Within the consortium, Materia Nova

  • Will build a continuum model for GDM on organic and hybrid PV structures
  • Will verify SMM results using a complementary scanning probe and related methods

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