System equipped with a Nanoscope IIIa controller for topographic, morphological and mechanical mapping. Operates in air or in liquid and in a temperature range of 20°C to 100°C

Advantages

  • Complete platform for: Morphological and mechanical properties of surfaces: Topography, standard roughness and film thickness measurements, Diversity of materials without size or thickness limits + Mapping of adhesion, deformation and dissipation properties simultaneously with topography. Determination of local Young's modulus. Electrical properties and charge transport mechanisms of (semi)conductive materials: local mapping of electric current, resistance, work function and surface potential. High electrical spatial resolution. Sensitivity of current measurements < 100fA. Measurements performed in controlled environment. Intelligent measurements: Controlled environment: liquids or inert gases, temperature control of the sample. Possible integration of new SPM modes
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